XAFS, SAXS and HREM characterization of Pd nanoparticles capped with n-alkyl thiol molecules

J. M. Ramallo-López, L. Giovanetti, A. F. Craievich, F. C. Vicentin, M. Marín-Almazo, M. José-Yacaman, F. G. Requejo

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

We report a structural characterization of palladium nanoparticles, with an average diameter of 1.2 nm, capped with three different n-alkyl thiol molecules (n=12, 16 and 18). For this purpose several experimental techniques were used, namely X-ray absorption fine structure (XAFS), small angle X-ray scattering (SAXS) and high-resolution electron transmission microscopy (HRTEM). SAXS and HRTEM results yielded the sizes of the Pd nanoparticles in each sample. The effects of sulfur-palladium interaction on the structural and electronic properties of the studied material were derived from XAFS results. This study indicates the presence of sulfurized palladium in the bulk of the three studied capped Pd nanoparticles. Slight variations in the degree of sulfidation were detected for nanoclusters with different thiol chain lengths.

Original languageEnglish (US)
Pages (from-to)150-154
Number of pages5
JournalPhysica B: Condensed Matter
Volume389
Issue number1
DOIs
StatePublished - Feb 1 2007
Externally publishedYes

Keywords

  • HRTEM
  • Palladium nanoparticles
  • SAXS
  • XAFS

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'XAFS, SAXS and HREM characterization of Pd nanoparticles capped with n-alkyl thiol molecules'. Together they form a unique fingerprint.

Cite this