X-ray diffraction and electron spectroscopy of epitaxial molecular C60 films
William M. Tong, Douglas A.A. Ohlberg, Hong K. You, R. Stanley Williams, Samir J. Anz, Marcos M. Alvarez, Robert L. Whetten, Yves Rubin, François N. Diederich
Research output: Contribution to journal › Article › peer-review
Dive into the research topics of 'X-ray diffraction and electron spectroscopy of epitaxial molecular C60 films'. Together they form a unique fingerprint.