X-ray diffraction and electron spectroscopy of epitaxial molecular C60 films

William M. Tong, Douglas A.A. Ohlberg, Hong K. You, R. Stanley Williams, Samir J. Anz, Marcos M. Alvarez, Robert L. Whetten, Yves Rubin, François N. Diederich

Research output: Contribution to journalArticlepeer-review

83 Scopus citations

Abstract

Films of the new carbon allotrope, molecular C60, also known as Buckminsterfullerene, have been grown on Si(111) substrates by molecular beam epitaxy. The films have been characterized with X-ray 2θ diffraction, X-ray photoelectron spectroscopy, Auger electron spectroscopy, and electron energy loss spectroscopy. The diffraction data from oriented films show that close-packed planes of C60 molecules are stacked parallel to the substrate surface but that the correlation length for X-ray scattering is less than 200 Å. The electron spectroscopic data show that the C atoms of C60 are essentially sp2-bonded, but there are significant differences with respect to graphite.

Original languageEnglish (US)
Pages (from-to)4709-4712
Number of pages4
JournalJournal of physical chemistry
Volume95
Issue number12
DOIs
StatePublished - 1991
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physical and Theoretical Chemistry

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