Towards automated composition of heterogeneous tests for cyber-physical systems

Alex Groce, Paul Flikkema, Josie Holmes

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A key trait of modern cyber-physical systems (CPS) is complexity due to the number of components and layers in these systems. Unlike in traditional software development, where the device layer is essentially completely abstracted away by an operating system, CPS components include low-power edge nodes, gateways, and servers that together provide sensing, actuation, communication, model and state inference, and autonomous or user-driven control. Moreover, the CPS design process involves implementation of these functions at different levels of abstraction, from high-level computational models to bare-mental implementations. Unfortunately, even when advanced testing or verification methods are applied only to low level system aspects, those efforts are separated from high-level tests of a CPS, which are often produced by a different team, and do not stress the low-level system. Effective automated test composition would make it possible to automatically produce integration/system tests for CPS, even with extremely heterogeneous aspects, where individual elements have effective tests but the interactions between the sub-systems are untested. Because of the size of the search space involved and the complexity of modeling and designing CPS, we also propose in the long term a move towards system architectures to support testing across both system layers and levels of abstraction.

Original languageEnglish (US)
Title of host publicationTECPS 2017 - Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems, co-located with ISSTA 2017
EditorsTingting Yu, Darko Marinov
PublisherAssociation for Computing Machinery, Inc
Pages12-15
Number of pages4
ISBN (Electronic)9781450351126
DOIs
StatePublished - Jul 13 2017
Event1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems, TECPS 2017 - Santa Barbara, United States
Duration: Jul 13 2017 → …

Publication series

NameTECPS 2017 - Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems, co-located with ISSTA 2017

Other

Other1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems, TECPS 2017
Country/TerritoryUnited States
CitySanta Barbara
Period7/13/17 → …

Keywords

  • Cyber-physical systems
  • Software architecture
  • Test composition

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Education

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