Abstract
The topographic mode of imaging has been used to study the systems Pd on graphite, Pt on graphite and Pt on alumina. It is shown that this method can provide information on the shape of the particles, on the morphology of the substrates (including steps on their surfaces) and on the distribution of the particles with respect to substrate features. It is also shown that with this method particles can be detected which, due to their smallness and to the presence of substrate noise, are otherwise invisible.
Original language | English (US) |
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Pages (from-to) | 120-124 |
Number of pages | 5 |
Journal | Surface and Interface Analysis |
Volume | 4 |
Issue number | 3 |
DOIs | |
State | Published - Jun 1982 |
Externally published | Yes |
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry