Keyphrases
Germanium Carbon
100%
Carbon Layer
100%
Metal-oxide-semiconductor Devices
100%
Transmission Electron Microscopy
50%
Material Characterization
50%
Secondary Ion Mass Spectrometry
50%
Growth Process
50%
High-resolution Electron Energy Loss Spectroscopy (HREELS)
50%
Diffraction
50%
Strain Relaxation
50%
Si(111)
50%
Strain Relaxation Mechanism
50%
Carbon Segregation
50%
High Vacuum Chemical Vapor Deposition
50%
Process Characterization
50%
Carbon Alloy
50%
Etch pit Density
50%
Low Threading Dislocation Density
50%
Material Science
Silicon
100%
Film
100%
Density
100%
Semiconductor Device
100%
Germanium
100%
Oxide Semiconductor
100%
Metal Oxide
100%
Transmission Electron Microscopy
50%
Secondary Ion Mass Spectrometry
50%
Electron Energy Loss Spectrometry
50%
Chemical Vapor Deposition
50%
Physics
Secondary Ion Mass Spectrometry
100%
Electron Energy
100%
Transmission Electron Microscopy
100%
Vapor Deposition
100%
Ultrahigh Vacuum
100%
Semiconductor Device
100%
Metal Oxide Semiconductor
100%