The structure and properties of amorphous indium oxide

Keyphrases

• Extended X-ray Absorption Fine Structure (EXAFS) 100%
• Indium Oxide 100%
• Electron Diffraction 50%
• Amorphous Oxides 50%
• X Ray Diffraction 50%
• Film Growth 50%
• Structure-property Relationships 50%
• Microscopy Electron 50%
• Amorphous Silica 50%
• Unique Structure 50%
• High-resolution Transmission Electron Microscopy (HRTEM) 50%
• Structure Dynamics 50%
• Transport Properties 50%
• Molecular Dynamics 50%
• Polyhedron 50%
• Crystalline-amorphous 50%
• Growth Temperature 50%
• Oxide Structure 50%
• Highly Crystalline 50%
• Pulsed Laser Deposition 50%
• Silica Substrate 50%
• Quench Simulation 50%
• Liquid Quench 50%
• Grazing Incidence X-ray Diffraction (GIXRD) 50%
• In2O3 Thin Film 50%
• Ab Initio Molecular Dynamics 50%
• Hall Transport 50%
• Transport Measurements 50%

Material Science

• Amorphous Material 100%
• Oxide Compound 100%
• Indium 100%
• Crystalline Material 37%
• X-Ray Diffraction 25%
• Extended X-Ray Absorption Fine Structure 25%
• Thin Films 12%
• Silicon Dioxide 12%
• Film Growth 12%
• High-Resolution Transmission Electron Microscopy 12%
• Electron Diffraction 12%
• Pulsed Laser Deposition 12%