The Evolution of Growth, Crystal Orientation, and Grain Boundaries Disorientation Distribution in Gold Thin Films

Prakash Parajuli, Rubén Mendoza-Cruz, Ulises Santiago, Arturo Ponce, Miguel José Yacamán

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Herein, the growth and annealing effect of gold thin films are systematically studied by using an automated crystal orientation mapping (ACOM–TEM) technique. The crystallographic redistribution and structural changes in grain and boundaries due to recrystallization and grain kinetic processes are followed and described. The as-grown films show a dominant <111> texture followed by <110>, <100>, <112>, <102>, and <212> orientations; having a noticeable reorientation of the grains after annealing along the <111> direction parallel to the electron beam, as well as the expected grain size enlargement. Moreover, the random high angle grain boundaries observed in as-grown film transform towards low coincidence site lattice (CSL) boundaries after annealing. The consequences of recrystallization and grain kinetic processes, primarily grain rotation and coupled grain boundary migration on the evolution of the film structural properties are discussed based on the experimental results.

Original languageEnglish (US)
Article number1800038
JournalCrystal Research and Technology
Volume53
Issue number8
DOIs
StatePublished - Aug 2018
Externally publishedYes

Keywords

  • annealing
  • crystal orientation
  • electron diffraction
  • grain boundaries
  • thin films

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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