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Temperature calibration of heated silicon atomic force microscope cantilevers
B. A. Nelson, W. P. King
Mechanical Engineering
Research output
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Contribution to journal
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Article
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peer-review
81
Scopus citations
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Dive into the research topics of 'Temperature calibration of heated silicon atomic force microscope cantilevers'. Together they form a unique fingerprint.
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Keyphrases
Atomic Force Microscope Cantilever
100%
Temperature Calibration
100%
Cantilever
75%
Raman Thermometry
50%
Silicon Cantilever
25%
Temperature-dependent Electrical Properties
25%
Nanofabrication
25%
Storage Time
25%
Burn-in
25%
Calibration Method
25%
Calibration Methodology
25%
Heat Transfer Model
25%
Surface Science
25%
Heating Cycle
25%
Calibration Standard
25%
Engineering
Atomic Force Microscope
100%
Temperature Calibration
100%
Isothermal
25%
Heating Cycle
25%
Measurement Science
25%
Experimental Measurement
25%
Calibration Standard
25%
Chemistry
Silicon
100%
Electrical Property
33%