Tamper-sensitive pre-formed ReRAM-based PUFs: Methods and experimental validation

Keyphrases

• Method Validation 100%
• Experimental Validation 100%
• Resistive Random Access Memory (ReRAM) 100%
• Physical Unclonable Function 100%
• On Demand 33%
• Temperature Effect 33%
• Operating Range 33%
• Inherent Properties 33%
• Cycle Frequency 33%
• High Current 33%
• Sensing Element 33%
• Generation Cycles 33%
• Current Sweep 33%
• Drift Rate 33%
• Injected Current 33%
• Destroy Mode 33%
• Repetitive Use 33%
• Voltage Sweep 33%
• Tampering Attack 33%
• Temperature Aging 33%
• Response Generation 33%

Computer Science

• Experimental Result 100%
• Sensing Element 100%
• Physical Design 100%
• Random Access Memory 100%
• Response Generation 100%

Engineering

• Experimental Result 100%
• Resistive Random Access Memory 100%
• Sensing Element 100%
• Successive Response 100%
• Operating Range 100%