Keyphrases
Method Validation
100%
Experimental Validation
100%
Resistive Random Access Memory (ReRAM)
100%
Physical Unclonable Function
100%
On Demand
33%
Temperature Effect
33%
Operating Range
33%
Inherent Properties
33%
Cycle Frequency
33%
High Current
33%
Sensing Element
33%
Generation Cycles
33%
Current Sweep
33%
Drift Rate
33%
Injected Current
33%
Destroy Mode
33%
Repetitive Use
33%
Voltage Sweep
33%
Tampering Attack
33%
Temperature Aging
33%
Response Generation
33%
Computer Science
Experimental Result
100%
Sensing Element
100%
Physical Design
100%
Random Access Memory
100%
Response Generation
100%
Engineering
Experimental Result
100%
Resistive Random Access Memory
100%
Sensing Element
100%
Successive Response
100%
Operating Range
100%