The contrast analysis of HREM images for nanoparticles supported in an amorphous substrate is studied. The particular case when these particles are embedded in a crystalline matrix is discussed. It is demonstrated that, depending on the substrate thickness, the particle contrast can show contrast artifacts along their edges. In some cases for thick substrates the particle image can even disappear. The contrast observed from particles embedded in a crystalline structure can fluctuate from invisibility to highly contrasted Moire patterns.
|Original language||English (US)|
|Number of pages||5|
|Journal||materials transactions, jim|
|State||Published - 1999|
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