Study of high resolution TEM images of nanoparticles either supported on amorphous films or embedded in a crystalline matrix

M. Jose Yacaman, C. Zorrilla, J. A. Ascencio, G. Mondragon, J. Reyes-Gasga

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

The contrast analysis of HREM images for nanoparticles supported in an amorphous substrate is studied. The particular case when these particles are embedded in a crystalline matrix is discussed. It is demonstrated that, depending on the substrate thickness, the particle contrast can show contrast artifacts along their edges. In some cases for thick substrates the particle image can even disappear. The contrast observed from particles embedded in a crystalline structure can fluctuate from invisibility to highly contrasted Moire patterns.

Original languageEnglish (US)
Pages (from-to)141-145
Number of pages5
Journalmaterials transactions, jim
Volume40
Issue number2
DOIs
StatePublished - 1999
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering

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