Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

Keyphrases

• Secondary Ion Mass Spectrometry 100%
• Nail Polish 100%
• Quadrupole 33%
• Partial Least Squares Structural Equation Modeling (PLS-SEM) 16%
• Principal Coordinate Analysis (PCoA) 16%
• High Spatial Resolution 16%
• Chemical Composition 16%
• Secondary Ion 16%
• Mass Spectrometry Methods 16%
• Multivariate Statistical Techniques 16%
• Ion Trap 16%
• MS-MS 16%
• Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) 16%
• Imaging Time 16%
• Fingernail 16%
• Mass Spectrometry Data 16%
• Partial Least Squares Analysis 16%
• Spectral Complexity 16%
• Charge Compensation 16%
• High Mass Resolution 16%
• Qualitative Characterization 16%
• Correct Identification 16%
• Coating Materials 16%
• Product Group 16%

Chemistry

• Secondary Ion Mass Spectroscopy 100%
• Quadrupole 33%
• Secondary Ion 16%
• Phase Composition 16%
• Ion Trap 16%
• Time-of-Flight Secondary Ion Mass Spectrometry 16%
• Tandem Mass Spectrometry 16%
• Coating Agent 16%