Resistive switching of SiOX with one diode-one resistor nanopillar architecture fabricated via nanosphere lithography

Li Ji, Yao Feng Chang, Burt Fowler, Ying Chen Chen, Tsung Ming Tsai, Kuan Chang Chang, Min Chen Chen, Ting Chang Chang, Simon M. Sze, Edward T. Yu, Jack C. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

Resistive random access memories (ReRAM) has attracted tremendous attention as a promising candidate for non-volatile memory. ReRAM can be classified into two categories: unipolar and bipolar memory. The advantage of unipolar memory is that it can be integrated into simple 1D-1R architecture with low static power consumption and constrained sneak-path issue. This is because unipolar memory does not require opposite voltage polarities for on/off switching [1]. SiO x has long been used as gate dielectrics for MOSFET and recently proved to be an active unipolar ReRAM material [2, 3]. Here we report SiO x-based 1D-1R high density nanopillar ReRAM via nanosphere lithography.

Original languageEnglish (US)
Title of host publication72nd Device Research Conference, DRC 2014 - Conference Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages243-244
Number of pages2
ISBN (Print)9781479954056
DOIs
StatePublished - 2014
Externally publishedYes
Event72nd Device Research Conference, DRC 2014 - Santa Barbara, CA, United States
Duration: Jun 22 2014Jun 25 2014

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Conference

Conference72nd Device Research Conference, DRC 2014
Country/TerritoryUnited States
CitySanta Barbara, CA
Period6/22/146/25/14

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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