@inproceedings{25d1f4e663a74150bd79b81c7aab6e74,
title = "Resistive switching of SiOX with one diode-one resistor nanopillar architecture fabricated via nanosphere lithography",
abstract = "Resistive random access memories (ReRAM) has attracted tremendous attention as a promising candidate for non-volatile memory. ReRAM can be classified into two categories: unipolar and bipolar memory. The advantage of unipolar memory is that it can be integrated into simple 1D-1R architecture with low static power consumption and constrained sneak-path issue. This is because unipolar memory does not require opposite voltage polarities for on/off switching [1]. SiO x has long been used as gate dielectrics for MOSFET and recently proved to be an active unipolar ReRAM material [2, 3]. Here we report SiO x-based 1D-1R high density nanopillar ReRAM via nanosphere lithography.",
author = "Li Ji and Chang, {Yao Feng} and Burt Fowler and Chen, {Ying Chen} and Tsai, {Tsung Ming} and Chang, {Kuan Chang} and Chen, {Min Chen} and Chang, {Ting Chang} and Sze, {Simon M.} and Yu, {Edward T.} and Lee, {Jack C.}",
year = "2014",
doi = "10.1109/DRC.2014.6872388",
language = "English (US)",
isbn = "9781479954056",
series = "Device Research Conference - Conference Digest, DRC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "243--244",
booktitle = "72nd Device Research Conference, DRC 2014 - Conference Digest",
note = "72nd Device Research Conference, DRC 2014 ; Conference date: 22-06-2014 Through 25-06-2014",
}