Reliability Improvement and Effective Switching Layer Model of Thin-Film MoS2 Memristors

Yifu Huang, Yuqian Gu, Sivasakthya Mohan, Andrei Dolocan, Nicholas D. Ignacio, Shanmukh Kutagulla, Kevin Matthews, Alejandra Londoño-Calderon, Yao Feng Chang, Ying Chen Chen, Jamie H. Warner, Michael T. Pettes, Jack C. Lee, Deji Akinwande

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