PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Amir Ali Pour, Vincent Beroulle, Bertrand Cambou, Jean Luc Danger, Giorgio Di Natale, David Hely, Sylvain Guilley, Naghmeh Karimi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

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Engineering & Materials Science