PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Amir Ali Pour, Vincent Beroulle, Bertrand Cambou, Jean Luc Danger, Giorgio Di Natale, David Hely, Sylvain Guilley, Naghmeh Karimi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Physically Unclonable Functions (PUFs) allow to extract unique fingerprints from silicon chips. The applications are numerous: chip identification, chip master key extraction, authentication protocol, unique seeding, etc. However, secure usage of PUF requires some precautions. This paper reviews industrial concerns associated with PUF operation, including those occurring before and after market. Namely, starting from PUF 'secure' specifications, aligned with state-of-the-art standards, we explore innovative techniques to handle enrollment and subsequent PUF queries, in nominal as well as in adversarial environment.

Original languageEnglish (US)
Title of host publicationProceedings - 2020 IEEE European Test Symposium, ETS 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728143125
DOIs
StatePublished - May 2020
Event2020 IEEE European Test Symposium, ETS 2020 - Tallinn, Estonia
Duration: May 25 2020May 29 2020

Publication series

NameProceedings of the European Test Workshop
Volume2020-May
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference2020 IEEE European Test Symposium, ETS 2020
Country/TerritoryEstonia
CityTallinn
Period5/25/205/29/20

Keywords

  • Challenge/Response Pair Database Management
  • Enrollment
  • On Line Test
  • Physically Unclonable Functions (PUF)
  • Standardization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Software

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