PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Amir Ali Pour; Vincent Beroulle; Bertrand Cambou; Jean Luc Danger; Giorgio Di Natale; David Hely; Sylvain Guilley; Naghmeh Karimi

doi:10.1109/ETS48528.2020.9131578

PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Amir Ali Pour, Vincent Beroulle, Bertrand Cambou, Jean Luc Danger, Giorgio Di Natale, David Hely, Sylvain Guilley, Naghmeh Karimi

Applied Physics and Materials Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Scopus citations

Abstract

Physically Unclonable Functions (PUFs) allow to extract unique fingerprints from silicon chips. The applications are numerous: chip identification, chip master key extraction, authentication protocol, unique seeding, etc. However, secure usage of PUF requires some precautions. This paper reviews industrial concerns associated with PUF operation, including those occurring before and after market. Namely, starting from PUF 'secure' specifications, aligned with state-of-the-art standards, we explore innovative techniques to handle enrollment and subsequent PUF queries, in nominal as well as in adversarial environment.

Original language	English (US)
Title of host publication	Proceedings - 2020 IEEE European Test Symposium, ETS 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728143125
DOIs	https://doi.org/10.1109/ETS48528.2020.9131578
State	Published - May 2020
Event	2020 IEEE European Test Symposium, ETS 2020 - Tallinn, Estonia Duration: May 25 2020 → May 29 2020

Publication series

Name	Proceedings of the European Test Workshop
Volume	2020-May
ISSN (Print)	1530-1877
ISSN (Electronic)	1558-1780

Conference

Conference	2020 IEEE European Test Symposium, ETS 2020
Country/Territory	Estonia
City	Tallinn
Period	5/25/20 → 5/29/20

Keywords

Challenge/Response Pair Database Management
Enrollment
On Line Test
Physically Unclonable Functions (PUF)
Standardization

ASJC Scopus subject areas

Electrical and Electronic Engineering
Industrial and Manufacturing Engineering
Software

Access to Document

10.1109/ETS48528.2020.9131578

Cite this

Pour, A. A., Beroulle, V., Cambou, B., Danger, J. L., Di Natale, G., Hely, D., Guilley, S., & Karimi, N. (2020). PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. In Proceedings - 2020 IEEE European Test Symposium, ETS 2020 Article 9131578 (Proceedings of the European Test Workshop; Vol. 2020-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ETS48528.2020.9131578

PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. / Pour, Amir Ali; Beroulle, Vincent; Cambou, Bertrand et al.
Proceedings - 2020 IEEE European Test Symposium, ETS 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9131578 (Proceedings of the European Test Workshop; Vol. 2020-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Pour, AA, Beroulle, V, Cambou, B, Danger, JL, Di Natale, G, Hely, D, Guilley, S & Karimi, N 2020, PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. in Proceedings - 2020 IEEE European Test Symposium, ETS 2020., 9131578, Proceedings of the European Test Workshop, vol. 2020-May, Institute of Electrical and Electronics Engineers Inc., 2020 IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, 5/25/20. https://doi.org/10.1109/ETS48528.2020.9131578

Pour AA, Beroulle V, Cambou B, Danger JL, Di Natale G, Hely D et al. PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. In Proceedings - 2020 IEEE European Test Symposium, ETS 2020. Institute of Electrical and Electronics Engineers Inc. 2020. 9131578. (Proceedings of the European Test Workshop). doi: 10.1109/ETS48528.2020.9131578

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PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Abstract

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Conference

Keywords

ASJC Scopus subject areas

Access to Document

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