Proton exchange reactions in SiOx-based resistive switching memory: Review and insights from impedance spectroscopy

Yao Feng Chang, Burt Fowler, Ying Chen Chen, Jack C. Lee

Research output: Contribution to journalReview articlepeer-review

45 Scopus citations

Fingerprint

Dive into the research topics of 'Proton exchange reactions in SiOx-based resistive switching memory: Review and insights from impedance spectroscopy'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science

Physics