Projectile K-Auger-electron production by bare, one-, and two-electron ions

Projectile K-Auger-electron production measurements were performed for the bare, one-, and two-electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of 14 to 23 MeV/amu using a cylindrical mirror analyzer. For the incident two-electron ions, single-electron capture to excited states of the (1s 2s)3S metastable component of the incident beam was the principal mechanism giving rise to the observed K-Auger transitions. For the bare and one-electron ions, double electron capture to excited states was the dominant mechanism leading to K-Auger-electron production. In addition to Auger-spectroscopy measurements, total K-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific n levels of the projectile. The n distributions were also measured for double electron capture to excited states of the bare and one-electron ions.