TY - JOUR
T1 - Projectile K-Auger-electron production by bare, one-, and two-electron ions
AU - Dillingham, T. R.
AU - Newcomb, J.
AU - Hall, James
AU - Pepmiller, Philip L.
AU - Richard, Patrick
N1 - Copyright:
Copyright 2021 Elsevier B.V., All rights reserved.
PY - 1984
Y1 - 1984
N2 - Projectile K-Auger-electron production measurements were performed for the bare, one-, and two-electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of 14 to 23 MeV/amu using a cylindrical mirror analyzer. For the incident two-electron ions, single-electron capture to excited states of the (1s 2s)3S metastable component of the incident beam was the principal mechanism giving rise to the observed K-Auger transitions. For the bare and one-electron ions, double electron capture to excited states was the dominant mechanism leading to K-Auger-electron production. In addition to Auger-spectroscopy measurements, total K-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific n levels of the projectile. The n distributions were also measured for double electron capture to excited states of the bare and one-electron ions.
AB - Projectile K-Auger-electron production measurements were performed for the bare, one-, and two-electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of 14 to 23 MeV/amu using a cylindrical mirror analyzer. For the incident two-electron ions, single-electron capture to excited states of the (1s 2s)3S metastable component of the incident beam was the principal mechanism giving rise to the observed K-Auger transitions. For the bare and one-electron ions, double electron capture to excited states was the dominant mechanism leading to K-Auger-electron production. In addition to Auger-spectroscopy measurements, total K-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific n levels of the projectile. The n distributions were also measured for double electron capture to excited states of the bare and one-electron ions.
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U2 - 10.1103/PhysRevA.29.3029
DO - 10.1103/PhysRevA.29.3029
M3 - Article
AN - SCOPUS:25044431682
SN - 1050-2947
VL - 29
SP - 3029
EP - 3038
JO - Physical Review A
JF - Physical Review A
IS - 6
ER -