Physical and chemical effects on crystalline H2 O2 induced by 20 keV protons

M. J. Loeffler, R. A. Baragiola

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4 Scopus citations


We present laboratory studies on radiation chemistry, sputtering, and amorphization of crystalline H2 O2 induced by 20 keV protons at 80 K. We used infrared spectroscopy to identify H2 O, O3, and possibly HO3, measure the fluence dependence of the fraction of crystalline and amorphous H2 O2 and of the production of H2 O and destruction of H2 O2. Furthermore, using complementary techniques, we observe that the sputtering yield depends on fluence due to the buildup of O2 radiation products in the sample. In addition, we find that the effective cross sections for the destruction of hydrogen peroxide and the production of water are very high compared to radiation chemical processes in water even though the fluence dependence of amorphization is nearly the same for the two materials. This result is consistent with a model of fast cooling of a liquid track produced by each projectile ion rather than with the disorder produced by the formation of radiolytic products.

Original languageEnglish (US)
Article number114504
JournalJournal of Chemical Physics
Issue number11
StatePublished - 2009
Externally publishedYes

ASJC Scopus subject areas

  • General Physics and Astronomy
  • Physical and Theoretical Chemistry


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