Keyphrases
Aberration-corrected
50%
Aberration-corrected Scanning Transmission Electron Microscopy
50%
Aberration-corrected STEM
100%
Ag Nanowires (AgNWs)
100%
Atomic Resolution
50%
Brightfield
50%
Carbon Nanotubes
50%
Chevron
50%
Crystalline Nanowires
50%
Desired Value
50%
Field Angle
50%
High Temperature
100%
High-angle Annular Dark Field (HAADF)
50%
High-angle Annular Dark-field Imaging
50%
In Situ Characterization
100%
In Situ Measurements
50%
Nanowires
50%
Room Temperature
50%
Scanning Transmission Electron Microscope
50%
Silver Nanowires
100%
Value-making
50%
Engineering
Carbon Nanotube
20%
Defects
20%
Field Angle
20%
Field Mode
20%
Nanowires
100%
Room Temperature
20%
Situ Measurement
20%
Transmissions
40%
Material Science
Carbon Nanotube
20%
Nanowire
100%
Scanning Transmission Electron Microscopy
20%
Silver
40%
Single Crystal
20%