Nanoscale inking, melting, and soldering with a heated atomic force microscope cantilever tip

William P. King; Brent A. Nelson; Tanya L. Wright; Paul A. Sheehan; Lloyd J. Whitman

doi:10.1115/IMECE2004-59126

Nanoscale inking, melting, and soldering with a heated atomic force microscope cantilever tip

William P. King, Brent A. Nelson, Tanya L. Wright, Paul A. Sheehan, Lloyd J. Whitman

Mechanical Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

The fabrication and use of a heated atomic force microscope (AFM) cantilevers for thermal dip pen nanolithography (tDPN) was investigated. A heated AFM cantilever was coated with ∼ 2 nm thickness octadecyl phosphonic acid, a small-molecule organic that melts at approximately 99°C. The AFM tip was scanning in contact with a mica substrate at four different locations and temperatures. The results showed that OPA was deposited from the cantilever tip only when the tip was hotter than the OPA melting temperature, and that the deposition rate is temperature-dependent.

Original language	English (US)
Pages	509-510
Number of pages	2
DOIs	https://doi.org/10.1115/IMECE2004-59126
State	Published - 2004
Event	2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004 - Anaheim, CA, United States Duration: Nov 13 2004 → Nov 19 2004

Other

Other	2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004
Country/Territory	United States
City	Anaheim, CA
Period	11/13/04 → 11/19/04

ASJC Scopus subject areas

Mechanical Engineering
Electrical and Electronic Engineering

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10.1115/IMECE2004-59126

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Nanoscale inking, melting, and soldering with a heated atomic force microscope cantilever tip. / King, William P.; Nelson, Brent A.; Wright, Tanya L. et al.
2004. 509-510 Paper presented at 2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004, Anaheim, CA, United States.

Research output: Contribution to conference › Paper › peer-review

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title = "Nanoscale inking, melting, and soldering with a heated atomic force microscope cantilever tip",

abstract = "The fabrication and use of a heated atomic force microscope (AFM) cantilevers for thermal dip pen nanolithography (tDPN) was investigated. A heated AFM cantilever was coated with ∼ 2 nm thickness octadecyl phosphonic acid, a small-molecule organic that melts at approximately 99°C. The AFM tip was scanning in contact with a mica substrate at four different locations and temperatures. The results showed that OPA was deposited from the cantilever tip only when the tip was hotter than the OPA melting temperature, and that the deposition rate is temperature-dependent.",

author = "King, {William P.} and Nelson, {Brent A.} and Wright, {Tanya L.} and Sheehan, {Paul A.} and Whitman, {Lloyd J.}",

year = "2004",

doi = "10.1115/IMECE2004-59126",

language = "English (US)",

pages = "509--510",

note = "2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004 ; Conference date: 13-11-2004 Through 19-11-2004",

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TY - CONF

T1 - Nanoscale inking, melting, and soldering with a heated atomic force microscope cantilever tip

AU - King, William P.

AU - Nelson, Brent A.

AU - Wright, Tanya L.

AU - Sheehan, Paul A.

AU - Whitman, Lloyd J.

PY - 2004

Y1 - 2004

N2 - The fabrication and use of a heated atomic force microscope (AFM) cantilevers for thermal dip pen nanolithography (tDPN) was investigated. A heated AFM cantilever was coated with ∼ 2 nm thickness octadecyl phosphonic acid, a small-molecule organic that melts at approximately 99°C. The AFM tip was scanning in contact with a mica substrate at four different locations and temperatures. The results showed that OPA was deposited from the cantilever tip only when the tip was hotter than the OPA melting temperature, and that the deposition rate is temperature-dependent.

AB - The fabrication and use of a heated atomic force microscope (AFM) cantilevers for thermal dip pen nanolithography (tDPN) was investigated. A heated AFM cantilever was coated with ∼ 2 nm thickness octadecyl phosphonic acid, a small-molecule organic that melts at approximately 99°C. The AFM tip was scanning in contact with a mica substrate at four different locations and temperatures. The results showed that OPA was deposited from the cantilever tip only when the tip was hotter than the OPA melting temperature, and that the deposition rate is temperature-dependent.

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M3 - Paper

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EP - 510

T2 - 2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004

Y2 - 13 November 2004 through 19 November 2004

ER -

Nanoscale inking, melting, and soldering with a heated atomic force microscope cantilever tip

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