In-situ transmission electron microscopy observation of the phase transition in thin films of the AlMn system

J. Reyes-Gasga, G. Mondragon-Galicia, M. José-Yacamán

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

AlMn thin films were produced by evaporation of the Al1-xMnx alloys, with x = 0.10, 0.14, 0.20, 0.25 and 0.32, on NaCl substrates held at either liquid-N2 temperature or room temperature. The thin films obtained showed an almost amorphous structure. When these films were heated in situ in the transmission electron microscope, several phases of the AlMn system were observed during the amorphous-to-crystalline transition process produced. The structural evolution observed on the chemical composition and the thickness of the film. Some of these phases were Al6Mn, Al3Mn, Al4Mn, Al11Mn4, Al8Mn5, AlMn and quasi-crystalline phases. On comparison of our results with the AlMn phase diagram, it is concluded that this diagram does not reproduce completely the situation for thin films.

Original languageEnglish (US)
Pages (from-to)24-31
Number of pages8
JournalThin Solid Films
Volume227
Issue number1
DOIs
StatePublished - May 5 1993
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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