Image processing in TEM using the wavelet transform

L. Beltrán del Río, A. Gómez, M. José-Yacamán

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

In this work the wavelet transform is used to process electron micrographs and simulated images. It is concluded that the edge sensitivity of the technique and its contrast enhancement capabilities are most useful in the processing of electron micrographs. In particular it is shown that the wavelet transform has some distinctive advantages over conventional Fourier transform filtering when analyzing images from samples that contain boundaries.

Original languageEnglish (US)
Pages (from-to)319-324
Number of pages6
JournalUltramicroscopy
Volume38
Issue number3-4
DOIs
StatePublished - Dec 1991
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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