Image processing in TEM using the wavelet transform

L. Beltrán del Río; A. Gómez; M. José-Yacamán

doi:10.1016/0304-3991(91)90165-3

Image processing in TEM using the wavelet transform

L. Beltrán del Río, A. Gómez, M. José-Yacamán

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

In this work the wavelet transform is used to process electron micrographs and simulated images. It is concluded that the edge sensitivity of the technique and its contrast enhancement capabilities are most useful in the processing of electron micrographs. In particular it is shown that the wavelet transform has some distinctive advantages over conventional Fourier transform filtering when analyzing images from samples that contain boundaries.

Original language	English (US)
Pages (from-to)	319-324
Number of pages	6
Journal	Ultramicroscopy
Volume	38
Issue number	3-4
DOIs	https://doi.org/10.1016/0304-3991(91)90165-3
State	Published - Dec 1991
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(91)90165-3

Cite this

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title = "Image processing in TEM using the wavelet transform",

abstract = "In this work the wavelet transform is used to process electron micrographs and simulated images. It is concluded that the edge sensitivity of the technique and its contrast enhancement capabilities are most useful in the processing of electron micrographs. In particular it is shown that the wavelet transform has some distinctive advantages over conventional Fourier transform filtering when analyzing images from samples that contain boundaries.",

author = "{del R{\'i}o}, {L. Beltr{\'a}n} and A. G{\'o}mez and M. Jos{\'e}-Yacam{\'a}n",

year = "1991",

month = dec,

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AU - del Río, L. Beltrán

AU - Gómez, A.

AU - José-Yacamán, M.

PY - 1991/12

Y1 - 1991/12

N2 - In this work the wavelet transform is used to process electron micrographs and simulated images. It is concluded that the edge sensitivity of the technique and its contrast enhancement capabilities are most useful in the processing of electron micrographs. In particular it is shown that the wavelet transform has some distinctive advantages over conventional Fourier transform filtering when analyzing images from samples that contain boundaries.

AB - In this work the wavelet transform is used to process electron micrographs and simulated images. It is concluded that the edge sensitivity of the technique and its contrast enhancement capabilities are most useful in the processing of electron micrographs. In particular it is shown that the wavelet transform has some distinctive advantages over conventional Fourier transform filtering when analyzing images from samples that contain boundaries.

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U2 - 10.1016/0304-3991(91)90165-3

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JO - Ultramicroscopy

JF - Ultramicroscopy

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ER -

Image processing in TEM using the wavelet transform

Abstract

ASJC Scopus subject areas

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