High-resolution topographical images of small metal particles

M. José Yacamán; T. Ocaña Z.

doi:10.1063/1.89400

High-resolution topographical images of small metal particles

M. José Yacamán, T. Ocaña Z.

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A technique to obtain high-resolution topographical information of particles in the Angstrom-size with a transmission electron microscope is described. This consists of obtaining dark-field images of particles which are tilted away from the Bragg angle and in a N-beam diffracting condition. The effective extinction distance is then substantially reduced and topographical analysis of the small crystallities can be obtained from Pendellösung fringes.

Original language	English (US)
Pages (from-to)	359-360
Number of pages	2
Journal	Applied Physics Letters
Volume	30
Issue number	7
DOIs	https://doi.org/10.1063/1.89400
State	Published - 1977
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.89400

Cite this

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title = "High-resolution topographical images of small metal particles",

abstract = "A technique to obtain high-resolution topographical information of particles in the Angstrom-size with a transmission electron microscope is described. This consists of obtaining dark-field images of particles which are tilted away from the Bragg angle and in a N-beam diffracting condition. The effective extinction distance is then substantially reduced and topographical analysis of the small crystallities can be obtained from Pendell{\"o}sung fringes.",

author = "Yacam{\'a}n, {M. Jos{\'e}} and {Oca{\~n}a Z.}, T.",

year = "1977",

doi = "10.1063/1.89400",

language = "English (US)",

volume = "30",

pages = "359--360",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "7",

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AU - Yacamán, M. José

AU - Ocaña Z., T.

PY - 1977

Y1 - 1977

N2 - A technique to obtain high-resolution topographical information of particles in the Angstrom-size with a transmission electron microscope is described. This consists of obtaining dark-field images of particles which are tilted away from the Bragg angle and in a N-beam diffracting condition. The effective extinction distance is then substantially reduced and topographical analysis of the small crystallities can be obtained from Pendellösung fringes.

AB - A technique to obtain high-resolution topographical information of particles in the Angstrom-size with a transmission electron microscope is described. This consists of obtaining dark-field images of particles which are tilted away from the Bragg angle and in a N-beam diffracting condition. The effective extinction distance is then substantially reduced and topographical analysis of the small crystallities can be obtained from Pendellösung fringes.

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U2 - 10.1063/1.89400

DO - 10.1063/1.89400

M3 - Article

AN - SCOPUS:25044480594

SN - 0003-6951

VL - 30

SP - 359

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 7

ER -

High-resolution topographical images of small metal particles

Abstract

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