High-resolution topographical images of small metal particles

M. José Yacamán, T. Ocaña Z.

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

A technique to obtain high-resolution topographical information of particles in the Angstrom-size with a transmission electron microscope is described. This consists of obtaining dark-field images of particles which are tilted away from the Bragg angle and in a N-beam diffracting condition. The effective extinction distance is then substantially reduced and topographical analysis of the small crystallities can be obtained from Pendellösung fringes.

Original languageEnglish (US)
Pages (from-to)359-360
Number of pages2
JournalApplied Physics Letters
Volume30
Issue number7
DOIs
StatePublished - 1977
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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