A technique to obtain high-resolution topographical information of particles in the Angstrom-size with a transmission electron microscope is described. This consists of obtaining dark-field images of particles which are tilted away from the Bragg angle and in a N-beam diffracting condition. The effective extinction distance is then substantially reduced and topographical analysis of the small crystallities can be obtained from Pendellösung fringes.
|Original language||English (US)|
|Number of pages||2|
|Journal||Applied Physics Letters|
|State||Published - 1977|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)