Graphene-supported high-resolution TEM and STEM imaging of silicon nanocrystals and their capping ligands

Matthew G. Panthani; Colin M. Hessel; Dariya Reid; Gilberto Casillas; Miguel José-Yacamán; Brian A. Korgel

doi:10.1021/jp308545q

Graphene-supported high-resolution TEM and STEM imaging of silicon nanocrystals and their capping ligands

Matthew G. Panthani, Colin M. Hessel, Dariya Reid, Gilberto Casillas, Miguel José-Yacamán, Brian A. Korgel

Research output: Contribution to journal › Article › peer-review

74 Scopus citations

Abstract

Using graphene as an ultrathin support, high-resolution transmission and scanning transmission electron microscopy (TEM and STEM) images of organic ligand-stabilized silicon (Si) nanocrystals with unprecedented clarity were obtained. TEM images of Si nanocrystals are usually obscured on conventional amorphous carbon TEM supports because of low atomic number (Z) contrast. The atomically thin graphene supports enabled clear images of the crystalline Si cores and, for the first time, organic capping ligands. Various twin defects were observed, often accompanied by very significant lattice distortion and anisotropic strain.

Original language	English (US)
Pages (from-to)	22463-22468
Number of pages	6
Journal	Journal of Physical Chemistry C
Volume	116
Issue number	42
DOIs	https://doi.org/10.1021/jp308545q
State	Published - Oct 25 2012
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Energy
Physical and Theoretical Chemistry
Surfaces, Coatings and Films

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abstract = "Using graphene as an ultrathin support, high-resolution transmission and scanning transmission electron microscopy (TEM and STEM) images of organic ligand-stabilized silicon (Si) nanocrystals with unprecedented clarity were obtained. TEM images of Si nanocrystals are usually obscured on conventional amorphous carbon TEM supports because of low atomic number (Z) contrast. The atomically thin graphene supports enabled clear images of the crystalline Si cores and, for the first time, organic capping ligands. Various twin defects were observed, often accompanied by very significant lattice distortion and anisotropic strain.",

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AU - Panthani, Matthew G.

AU - Hessel, Colin M.

AU - Reid, Dariya

AU - Casillas, Gilberto

AU - José-Yacamán, Miguel

AU - Korgel, Brian A.

PY - 2012/10/25

Y1 - 2012/10/25

N2 - Using graphene as an ultrathin support, high-resolution transmission and scanning transmission electron microscopy (TEM and STEM) images of organic ligand-stabilized silicon (Si) nanocrystals with unprecedented clarity were obtained. TEM images of Si nanocrystals are usually obscured on conventional amorphous carbon TEM supports because of low atomic number (Z) contrast. The atomically thin graphene supports enabled clear images of the crystalline Si cores and, for the first time, organic capping ligands. Various twin defects were observed, often accompanied by very significant lattice distortion and anisotropic strain.

AB - Using graphene as an ultrathin support, high-resolution transmission and scanning transmission electron microscopy (TEM and STEM) images of organic ligand-stabilized silicon (Si) nanocrystals with unprecedented clarity were obtained. TEM images of Si nanocrystals are usually obscured on conventional amorphous carbon TEM supports because of low atomic number (Z) contrast. The atomically thin graphene supports enabled clear images of the crystalline Si cores and, for the first time, organic capping ligands. Various twin defects were observed, often accompanied by very significant lattice distortion and anisotropic strain.

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ER -

Graphene-supported high-resolution TEM and STEM imaging of silicon nanocrystals and their capping ligands

Abstract

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