Graphene-supported high-resolution TEM and STEM imaging of silicon nanocrystals and their capping ligands

Matthew G. Panthani, Colin M. Hessel, Dariya Reid, Gilberto Casillas, Miguel José-Yacamán, Brian A. Korgel

Research output: Contribution to journalArticlepeer-review

61 Scopus citations

Abstract

Using graphene as an ultrathin support, high-resolution transmission and scanning transmission electron microscopy (TEM and STEM) images of organic ligand-stabilized silicon (Si) nanocrystals with unprecedented clarity were obtained. TEM images of Si nanocrystals are usually obscured on conventional amorphous carbon TEM supports because of low atomic number (Z) contrast. The atomically thin graphene supports enabled clear images of the crystalline Si cores and, for the first time, organic capping ligands. Various twin defects were observed, often accompanied by very significant lattice distortion and anisotropic strain.

Original languageEnglish (US)
Pages (from-to)22463-22468
Number of pages6
JournalJournal of Physical Chemistry C
Volume116
Issue number42
DOIs
StatePublished - Oct 25 2012
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Energy(all)
  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films

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