Fuzzy Key Generator Design using ReRAM-Based Physically Unclonable Functions

Ashwija Reddy Korenda, Fatemeh Afghah, Abolfazl Razi, Bertrand Cambou, Taylor Begay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Physical unclonable functions (PUFs) are used to create unique device identifiers from their inherent fabrication variability. Unstable readings and variation of the PUF response over time are key issues that limit the applicability of PUFs in real-world systems. In this project, we developed a fuzzy extractor (FE) to generate robust cryptographic keys from ReRAM-based PUFs. We tested the efficiency of the proposed FE using BCH and Polar error correction codes. We use ReRAM-based PUFs operating in pre-forming range to generate binary cryptographic keys at ultra-low power with an objective of tamper sensitivity. We investigate the performance of the proposed FE with real data using the reading of the resistance of pre-formed ReRAM cells under various noise conditions. The results show a bit error rate (BER) in the range of 10-5 for the Polar-codes based method when 10% of the ReRAM cell array is erroneous at Signal to Noise Ratio (SNR) of 20dB.This error rate is achieved by using helper data length of 512 bits for a 256 bit cryptographic key. Our method uses a 2:1 ratio for helper data and key, much lower than the majority of previously reported methods. This property makes our method more robust against helper data attacks.1

Original languageEnglish (US)
Title of host publicationProceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665410106
DOIs
StatePublished - 2021
Event2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021 - Virtual, Online, United States
Duration: Nov 30 2021Dec 2 2021

Publication series

NameProceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021

Conference

Conference2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021
Country/TerritoryUnited States
CityVirtual, Online
Period11/30/2112/2/21

Keywords

  • Fuzzy extractors
  • hardware-based authentication
  • IoT security
  • Physically unclonable functions
  • ReRAM technology

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Fuzzy Key Generator Design using ReRAM-Based Physically Unclonable Functions'. Together they form a unique fingerprint.

Cite this