TY - GEN
T1 - Fuzzy Key Generator Design using ReRAM-Based Physically Unclonable Functions
AU - Korenda, Ashwija Reddy
AU - Afghah, Fatemeh
AU - Razi, Abolfazl
AU - Cambou, Bertrand
AU - Begay, Taylor
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - Physical unclonable functions (PUFs) are used to create unique device identifiers from their inherent fabrication variability. Unstable readings and variation of the PUF response over time are key issues that limit the applicability of PUFs in real-world systems. In this project, we developed a fuzzy extractor (FE) to generate robust cryptographic keys from ReRAM-based PUFs. We tested the efficiency of the proposed FE using BCH and Polar error correction codes. We use ReRAM-based PUFs operating in pre-forming range to generate binary cryptographic keys at ultra-low power with an objective of tamper sensitivity. We investigate the performance of the proposed FE with real data using the reading of the resistance of pre-formed ReRAM cells under various noise conditions. The results show a bit error rate (BER) in the range of 10-5 for the Polar-codes based method when 10% of the ReRAM cell array is erroneous at Signal to Noise Ratio (SNR) of 20dB.This error rate is achieved by using helper data length of 512 bits for a 256 bit cryptographic key. Our method uses a 2:1 ratio for helper data and key, much lower than the majority of previously reported methods. This property makes our method more robust against helper data attacks.1
AB - Physical unclonable functions (PUFs) are used to create unique device identifiers from their inherent fabrication variability. Unstable readings and variation of the PUF response over time are key issues that limit the applicability of PUFs in real-world systems. In this project, we developed a fuzzy extractor (FE) to generate robust cryptographic keys from ReRAM-based PUFs. We tested the efficiency of the proposed FE using BCH and Polar error correction codes. We use ReRAM-based PUFs operating in pre-forming range to generate binary cryptographic keys at ultra-low power with an objective of tamper sensitivity. We investigate the performance of the proposed FE with real data using the reading of the resistance of pre-formed ReRAM cells under various noise conditions. The results show a bit error rate (BER) in the range of 10-5 for the Polar-codes based method when 10% of the ReRAM cell array is erroneous at Signal to Noise Ratio (SNR) of 20dB.This error rate is achieved by using helper data length of 512 bits for a 256 bit cryptographic key. Our method uses a 2:1 ratio for helper data and key, much lower than the majority of previously reported methods. This property makes our method more robust against helper data attacks.1
KW - Fuzzy extractors
KW - IoT security
KW - Physically unclonable functions
KW - ReRAM technology
KW - hardware-based authentication
UR - http://www.scopus.com/inward/record.url?scp=85126049027&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85126049027&partnerID=8YFLogxK
U2 - 10.1109/PAINE54418.2021.9707714
DO - 10.1109/PAINE54418.2021.9707714
M3 - Conference contribution
AN - SCOPUS:85126049027
T3 - Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021
BT - Proceedings of the 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2021
Y2 - 30 November 2021 through 2 December 2021
ER -