Exploiting abstraction, learning from random simulation, and SVM classification for efficient dynamic prediction of software health problems

Miroslav N. Velev, Chaoqiang Zhang, Ping Gao, Alex D. Groce

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present industrial experience on software health monitoring. Our goal was to determine whether we can predict abnormal behavior, based on data captured from software system interfaces. To analyze the system state and predict software health problems, we used Support Vector Machine (SVM) based analysis. To train the SVM, we exploited random testing with feedback and swarm testing with feedback to generate traces that exercise diverse scenarios, including both normal and abnormal behaviors that can be classified based on the system state after completing an API call. We then used the resulting classifier produced by the SVM-based analysis to predict whether an API call will result in abnormal behavior, given the input values to the API, and other system information. We applied this procedure to a subset of the API functions in the YAFFS2 flash file system, with the objective of predicting whether the health parameter of available free space will go below a threshold, relative to the total space in the flash file system. For several API functions, we achieved prediction accuracy of over 96%. We attribute the high prediction accuracy to using random testing with feedback that is optimized to produce execution traces with highly diverse behavior, which combined with the chosen representation of the system state and length of the traces resulted in a sufficient number of training vectors with diverse numeric values for the API functions of interest.

Original languageEnglish (US)
Title of host publicationProceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015
PublisherIEEE Computer Society
Pages412-418
Number of pages7
ISBN (Electronic)9781479975815
DOIs
StatePublished - Apr 13 2015
Externally publishedYes
Event16th International Symposium on Quality Electronic Design, ISQED 2015 - Santa Clara, United States
Duration: Mar 2 2015Mar 4 2015

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2015-April
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference16th International Symposium on Quality Electronic Design, ISQED 2015
Country/TerritoryUnited States
CitySanta Clara
Period3/2/153/4/15

Keywords

  • Abstraction
  • SVM
  • Software health monitoring
  • learning

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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