Patch potentials arising from the polycrystalline structure of material samples may contribute significantly to measured signals in Casimir force experiments. Most of these experiments are performed in the sphere-plane geometry; yet, up to now all analysis of patch effects has been taken into account using the proximity force approximation which, in essence, treats the sphere as a plane. In this paper we present the exact solution for the electrostatic patch interaction energy in the sphere-plane geometry and derive exact analytical formulas for the electrostatic patch force and minimizing potential. We perform numerical simulations to analyze the distance dependence of the minimizing potential as a function of patch size, and we quantify the sphere-plane patch force for a particular patch layout. Once the patch potentials on both surfaces are measured by dedicated experiments our formulas can be used to exactly quantify the sphere-plane patch force in the particular experimental situation.
|Original language||English (US)|
|Journal||Physical Review A - Atomic, Molecular, and Optical Physics|
|State||Published - Nov 16 2012|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics