Electron emission mechanism for impact of CN- and SlN- clusters

Pamela M. St. John, Chahan Yeretzian, Robert L. Whetten

Research output: Contribution to journalArticlepeer-review

20 Scopus citations


Surface collisions of negatively charged atomic clusters CN- and SiN-, N < 15, have been investigated by time-of-flight methods. At low impact velocities (<10 km/s), the intact scattered ion and its charged fragments are clearly observed, along with ejected electrons. The time profile for the electron is broad and asymmetric, proving that it arises from delayed emission from the intact scattered negative ion. This provides a simple explanation for the low-energy emission found by Achiba and co-workers which they attribute to cluster electronic excitation. The relative yield of ions and electrons suggests that fragmentation and electron emission are competing processes for cooling the hot scattered ion.

Original languageEnglish (US)
Pages (from-to)9100-9104
Number of pages5
JournalJournal of physical chemistry
Issue number23
StatePublished - 1992
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering
  • Physical and Theoretical Chemistry


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