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Efficient Design of MET-LDPC Code Ensembles via Multinomial Parameter Optimization

  • Linh Nguyen
  • , Tuy Tan Nguyen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Designing multi-edge type low-density parity-check (MET-LDPC) code ensembles that satisfy structural constraints while achieving near-capacity performance remains a challenging problem. Existing methods, including those based on differential evolution, have improved flexibility but still face limitations such as high computational cost and the need for manual configuration of edge patterns. We propose an optimization-based method that explores diverse, structurally feasible edge distribution candidates and optimizes node distributions via a constrained linear system formulation. A dual annealing optimizer is then applied to identify node profiles that maximize the decoding threshold. Evaluations on both the binary erasure channel and the binary-input additive white Gaussian noise channel across multiple code rates show that our method consistently produces ensembles with strong threshold performance and low edge complexity, highlighting its practicality and adaptability.

Original languageEnglish (US)
Title of host publication2025 IEEE Military Communications Conference, MILCOM 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages539-544
Number of pages6
ISBN (Electronic)9798331502928
DOIs
StatePublished - 2025
Externally publishedYes
Event2025 IEEE Military Communications Conference, MILCOM 2025 - Los Angeles, United States
Duration: Oct 6 2025Oct 10 2025

Publication series

NameProceedings - IEEE Military Communications Conference MILCOM
ISSN (Print)2155-7578
ISSN (Electronic)2155-7586

Conference

Conference2025 IEEE Military Communications Conference, MILCOM 2025
Country/TerritoryUnited States
CityLos Angeles
Period10/6/2510/10/25

Keywords

  • decoding threshold
  • dual annealing
  • MET-LDPC code ensembles
  • near-capacity performance
  • optimization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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