Dynamic conductance characteristics in HfOx-based resistive random access memory

Ying Chen Chen, Yao Feng Chang, Xiaohan Wu, Fei Zhou, Meiqi Guo, Chih Yang Lin, Cheng Chih Hsieh, Burt Fowler, Ting Chang Chang, Jack C. Lee

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

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