Dynamic conductance characteristics in HfOx-based resistive random access memory
- Ying Chen Chen
- , Yao Feng Chang
- , Xiaohan Wu
- , Fei Zhou
- , Meiqi Guo
- , Chih Yang Lin
- , Cheng Chih Hsieh
- , Burt Fowler
- , Ting Chang Chang
- , Jack C. Lee
Research output: Contribution to journal › Article › peer-review
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