Abstract
The defect structure of bimetallic nanoparticles differs from that of particles made of a single atomic species. Using high resolution TEM imaging along with molecular dynamics simulations, it is possible to investigate the nature and features of these defects. The definition of a local order parameter allows one to locate regions with different kinds of stacking on the simulated nanoparticles and thus to make a direct comparison with the experimental observations.
Original language | English (US) |
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Pages (from-to) | 1035-1038 |
Number of pages | 4 |
Journal | Journal of Materials Chemistry |
Volume | 17 |
Issue number | 11 |
DOIs | |
State | Published - 2007 |
Externally published | Yes |
ASJC Scopus subject areas
- General Chemistry
- Materials Chemistry