The defect structure of bimetallic nanoparticles differs from that of particles made of a single atomic species. Using high resolution TEM imaging along with molecular dynamics simulations, it is possible to investigate the nature and features of these defects. The definition of a local order parameter allows one to locate regions with different kinds of stacking on the simulated nanoparticles and thus to make a direct comparison with the experimental observations.
|Original language||English (US)|
|Number of pages||4|
|Journal||Journal of Materials Chemistry|
|State||Published - 2007|
ASJC Scopus subject areas
- Materials Chemistry