Comprehensive trap-level study in SiOx-based resistive switching memory

Yao Feng Chang, Ying Chen Chen, Ji Li, Fei Xue, Yanzhen Wang, Fei Zhou, Burt Fowler, Jack C. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Scopus citations
Original languageEnglish (US)
Title of host publication71st Device Research Conference, DRC 2013 - Conference Digest
Pages135-136
Number of pages2
DOIs
StatePublished - 2013
Externally publishedYes
Event71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States
Duration: Jun 23 2013Jun 26 2013

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Conference

Conference71st Device Research Conference, DRC 2013
Country/TerritoryUnited States
CityNotre Dame, IN
Period6/23/136/26/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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