Comprehensive trap-level study in SiOx-based resistive switching memory

Yao Feng Chang; Ying Chen Chen; Ji Li; Fei Xue; Yanzhen Wang; Fei Zhou; Burt Fowler; Jack C. Lee

doi:10.1109/DRC.2013.6633830

Comprehensive trap-level study in SiO_x-based resistive switching memory

Yao Feng Chang, Ying Chen Chen, Ji Li, Fei Xue, Yanzhen Wang, Fei Zhou, Burt Fowler, Jack C. Lee

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	71st Device Research Conference, DRC 2013 - Conference Digest
Pages	135-136
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2013.6633830
State	Published - 2013
Externally published	Yes
Event	71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States Duration: Jun 23 2013 → Jun 26 2013

Publication series

Name	Device Research Conference - Conference Digest, DRC
ISSN (Print)	1548-3770

Conference

Conference	71st Device Research Conference, DRC 2013
Country/Territory	United States
City	Notre Dame, IN
Period	6/23/13 → 6/26/13

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/DRC.2013.6633830

Cite this

Chang, YF, Chen, YC, Li, J, Xue, F, Wang, Y, Zhou, F, Fowler, B & Lee, JC 2013, Comprehensive trap-level study in SiO_x-based resistive switching memory. in 71st Device Research Conference, DRC 2013 - Conference Digest., 6633830, Device Research Conference - Conference Digest, DRC, pp. 135-136, 71st Device Research Conference, DRC 2013, Notre Dame, IN, United States, 6/23/13. https://doi.org/10.1109/DRC.2013.6633830

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title = "Comprehensive trap-level study in SiOx-based resistive switching memory",

author = "Chang, {Yao Feng} and Chen, {Ying Chen} and Ji Li and Fei Xue and Yanzhen Wang and Fei Zhou and Burt Fowler and Lee, {Jack C.}",

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language = "English (US)",

isbn = "9781479908110",

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note = "71st Device Research Conference, DRC 2013 ; Conference date: 23-06-2013 Through 26-06-2013",

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AU - Fowler, Burt

AU - Lee, Jack C.

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T3 - Device Research Conference - Conference Digest, DRC

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EP - 136

BT - 71st Device Research Conference, DRC 2013 - Conference Digest

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