Compliance current and temperature effects on non-volatile memory switching and volatile switching dynamics in a Cu/SiOx/p++-Si device

Sung Joon Yoon, Ji Ho Ryu, Muhammad Ismail, Ying Chen Chen, Yao Feng Chang, Min Ju Yun, Hee Dong Kim, Sungjun Kim

Research output: Contribution to journal › Article › peer-review

22 Scopus citations

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Engineering

Physics

Biochemistry, Genetics and Molecular Biology

Material Science