Characterization of surface roughness and lattice distortions in nanostructures

M. Jose-Yacaman, S. Tehuacanero, C. Zorrilla

Research output: Contribution to conferencePaperpeer-review

Abstract

In the present work we report a systematic study of roughness and lattice distortion in metallic nanoparticles using High Resolution Electron Microscopy (HREM). Theoretical calculations show that images at only a very limited objective lens defocus, show faithfully the surface roughness. We found also possible to determine real lattice distortions in FCC cubo-octahedral particles.

Original languageEnglish (US)
Pages135-141
Number of pages7
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1997 TMS Annual Meeting - Orlando, FL, USA
Duration: Feb 9 1997Feb 13 1997

Conference

ConferenceProceedings of the 1997 TMS Annual Meeting
CityOrlando, FL, USA
Period2/9/972/13/97

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys

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