Characterization of supported catalysts by transmission electron microscopy (review)

Research output: Contribution to journalReview articlepeer-review

25 Scopus citations

Abstract

In the present work several techniques for the characterization of real catalysts are reviewed. These include weak multi-beam images, topographic refraction images, dark field and micro-diffraction. With the combined use of these techniques it is possible to obtain the shape, crystal structure and reliable size distribution of metal particles. A method that permits the visualization of particles below to 10 Å, as well as the determination of the line substrate topography for supported catalysts is discussed.

Original languageEnglish (US)
Pages (from-to)1-25
Number of pages25
JournalApplied Catalysis
Volume13
Issue number1
DOIs
StatePublished - 1984
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering

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