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Characterization of SiOx/HfOx bilayer resistive-switching memory devices
Ying Chen Chen, Yao Feng Chang, Xiaohan Wu, Meiqi Guo, Burt Fowler, Fei Zhou, Chih Hung Pan, Ting Chang Chang, Jack C. Lee
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
8
Scopus
citations