Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM

Jesús Cantú Valle; Arturo Ponce; Ravi Droopad; Rocío Contreras-Guerrero; Miguel José-Yacaman

doi:10.1017/S1431927612009099

Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM

Jesús Cantú Valle
, Arturo Ponce
, Ravi Droopad
, Rocío Contreras-Guerrero
, Miguel José-Yacaman

Research output: Contribution to journal › Article › peer-review

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Original language	English (US)
Pages (from-to)	1448-1449
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612009099
State	Published - Jul 2012
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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@article{b1d1fcb2e0c4450c9d450daa8ef77aaa,

title = "Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM",

abstract = "Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.",

author = "\{Cant{\'u} Valle\}, Jes{\'u}s and Arturo Ponce and Ravi Droopad and Roc{\'i}o Contreras-Guerrero and Miguel Jos{\'e}-Yacaman",

year = "2012",

month = jul,

doi = "10.1017/S1431927612009099",

language = "English (US)",

volume = "18",

pages = "1448--1449",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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TY - JOUR

T1 - Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM

AU - Cantú Valle, Jesús

AU - Ponce, Arturo

AU - Droopad, Ravi

AU - Contreras-Guerrero, Rocío

AU - José-Yacaman, Miguel

PY - 2012/7

Y1 - 2012/7

N2 - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

AB - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

UR - https://www.scopus.com/pages/publications/85011457650

UR - https://www.scopus.com/pages/publications/85011457650#tab=citedBy

U2 - 10.1017/S1431927612009099

DO - 10.1017/S1431927612009099

M3 - Article

AN - SCOPUS:85011457650

SN - 1431-9276

VL - 18

SP - 1448

EP - 1449

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM

Abstract

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