Characterization of heteroepitaxial multiferroic interface BiFeO3/SrTiO3/Si by Cs-corrected STEM

Jesús Cantú Valle, Arturo Ponce, Ravi Droopad, Rocío Contreras-Guerrero, Miguel José-Yacaman

Research output: Contribution to journalArticlepeer-review

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Original languageEnglish (US)
Pages (from-to)1448-1449
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
StatePublished - Jul 2012
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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