Keyphrases
Substrate Interface
100%
Strain Relaxation Mechanism
100%
Germanium Carbon
100%
Carbon Layer
100%
Carbon Segregation
100%
High-resolution Electron Energy Loss Spectroscopy (HREELS)
66%
Si Substrate
66%
Energy Dispersive X-ray Spectroscopy
33%
Secondary Ion Mass Spectrometry
33%
Complex Forms
33%
Central Region
33%
Spectroscopic Analysis
33%
Energy Filtered Transmission Electron Microscopy (EFTEM)
33%
Strain Relaxation
33%
Surface Interface
33%
Substitutional Site
33%
Ge Crystal
33%
Structural Relaxation
33%
Si(111)
33%
Chemical Relaxation
33%
Chemistry
Silicon
100%
Relaxation
100%
Germanium
100%
Electron Energy Loss Spectroscopy
66%
Liquid Film
33%
Secondary Ion Mass Spectroscopy
33%
Transmission Electron Microscopy
33%
Structural Relaxation
33%
Energy-Dispersive Spectroscopy
33%
Material Science
Silicon
100%
Electron Energy Loss Spectrometry
100%
Germanium
100%
Film
50%
Transmission Electron Microscopy
50%
Secondary Ion Mass Spectrometry
50%
Structural Relaxation
50%