Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope

Jesus Cantu-Valle; Francisco Ruiz-Zepeda; Fernando Mendoza-Santoyo; Miguel Jose-Yacaman; Arturo Ponce

doi:10.1016/j.ultramic.2014.06.003

Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope

Jesus Cantu-Valle
, Francisco Ruiz-Zepeda
, Fernando Mendoza-Santoyo
, Miguel Jose-Yacaman
, Arturo Ponce

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35. nm to 2.5. μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.

Original language	English (US)
Pages (from-to)	44-50
Number of pages	7
Journal	Ultramicroscopy
Volume	147
DOIs	https://doi.org/10.1016/j.ultramic.2014.06.003
State	Published - Dec 2014
Externally published	Yes

Keywords

Dual-lens imaging
Electron holography
Electron optics
Metallic nanoparticles
Phase reconstruction

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/j.ultramic.2014.06.003

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title = "Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope",

abstract = "In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35. nm to 2.5. μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.",

keywords = "Dual-lens imaging, Electron holography, Electron optics, Metallic nanoparticles, Phase reconstruction",

author = "Jesus Cantu-Valle and Francisco Ruiz-Zepeda and Fernando Mendoza-Santoyo and Miguel Jose-Yacaman and Arturo Ponce",

note = "Funding Information: This project was supported by grants from the National Center for Research Resources ( 5 G12RR013646-12 ) and the National Institute on Minority Health and Health Disparities ( G12MD007591 ) from the National Institutes of Health . The authors would also like to acknowledge the NSF PREM \# DMR 0934218. A special recognition to Holowerks LLC., and Dr. Edgar Voelkl for their guidance and support. Also, would like to acknowledge Dr. Masahiro Kawasaki for his help in the microscope configuration. Fernando Mendoza Santoyo gratefully acknowledges the Sabbatical grant from CONACYT. Finally, the authors would like to acknowledge grants from CONACYT Mexico and the Instituto de Innovaci{\'o}n y Transferencia de Tecnolog{\'i}ca de Nuevo Le{\'o}n I²T² \# 311149 . Finally, the authors would like to acknowledge to the Department of Defense \#64756-RT-REP. ",

year = "2014",

month = dec,

doi = "10.1016/j.ultramic.2014.06.003",

language = "English (US)",

volume = "147",

pages = "44--50",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

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T1 - Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope

AU - Cantu-Valle, Jesus

AU - Ruiz-Zepeda, Francisco

AU - Mendoza-Santoyo, Fernando

AU - Jose-Yacaman, Miguel

AU - Ponce, Arturo

N1 - Funding Information: This project was supported by grants from the National Center for Research Resources ( 5 G12RR013646-12 ) and the National Institute on Minority Health and Health Disparities ( G12MD007591 ) from the National Institutes of Health . The authors would also like to acknowledge the NSF PREM # DMR 0934218. A special recognition to Holowerks LLC., and Dr. Edgar Voelkl for their guidance and support. Also, would like to acknowledge Dr. Masahiro Kawasaki for his help in the microscope configuration. Fernando Mendoza Santoyo gratefully acknowledges the Sabbatical grant from CONACYT. Finally, the authors would like to acknowledge grants from CONACYT Mexico and the Instituto de Innovación y Transferencia de Tecnologíca de Nuevo León I²T² # 311149 . Finally, the authors would like to acknowledge to the Department of Defense #64756-RT-REP.

PY - 2014/12

Y1 - 2014/12

N2 - In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35. nm to 2.5. μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.

AB - In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35. nm to 2.5. μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.

KW - Dual-lens imaging

KW - Electron holography

KW - Electron optics

KW - Metallic nanoparticles

KW - Phase reconstruction

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M3 - Article

C2 - 25016585

AN - SCOPUS:84904289002

SN - 0304-3991

VL - 147

SP - 44

EP - 50

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -

Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope

Abstract

Keywords

ASJC Scopus subject areas

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