Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope

Jesus Cantu-Valle, Francisco Ruiz-Zepeda, Fernando Mendoza-Santoyo, Miguel Jose-Yacaman, Arturo Ponce

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35. nm to 2.5. μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses.

Original languageEnglish (US)
Pages (from-to)44-50
Number of pages7
JournalUltramicroscopy
Volume147
DOIs
StatePublished - Dec 2014
Externally publishedYes

Keywords

  • Dual-lens imaging
  • Electron holography
  • Electron optics
  • Metallic nanoparticles
  • Phase reconstruction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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