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Atomic force microscope studies of fullerene films: Highly stable C60 fcc (311) free surfaces
Eric J. Snyder, Mark S. Anderson, William M. Tong, R. Stanley Williams, Samir J. Anz, Marcos M. Alvarez, Yves Rubin, François N. Diederich, Robert L. Whetten
Research output: Contribution to journal › Article › peer-review
60
Scopus
citations