Atomic force microscope studies of fullerene films: Highly stable C 60 fcc (311) free surfaces

Eric J. Snyder, Mark S. Anderson, William M. Tong, R. Stanley Williams, Samir J. Anz, Marcos M. Alvarez, Yves Rubin, François N. Diederich, Robert L. Whetten

Research output: Contribution to journalArticlepeer-review

57 Scopus citations

Abstract

Atomic force microscopy and x-ray diffractometry were used to study 1500 Å-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

Original languageEnglish (US)
Pages (from-to)171-173
Number of pages3
JournalScience
Volume253
Issue number5016
DOIs
StatePublished - 1991
Externally publishedYes

ASJC Scopus subject areas

  • General

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