Atomic force microscope studies of fullerene films: Highly stable C60 fcc (311) free surfaces

Eric J. Snyder; Mark S. Anderson; William M. Tong; R. Stanley Williams; Samir J. Anz; Marcos M. Alvarez; Yves Rubin; François N. Diederich; Robert L. Whetten

Atomic force microscope studies of fullerene films: Highly stable C₆₀ fcc (311) free surfaces

Eric J. Snyder, Mark S. Anderson, William M. Tong, R. Stanley Williams, Samir J. Anz, Marcos M. Alvarez, Yves Rubin, François N. Diederich, Robert L. Whetten

Research output: Contribution to journal › Article › peer-review

60 Scopus citations

Abstract

Atomic force microscopy and x-ray diffractometry were used to study 1500 Å-thick films of pure C₆₀ grown by sublimation in ultrahigh vacuum onto a CaF₂ (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

Original language	English (US)
Pages (from-to)	171-173
Number of pages	3
Journal	Science
Volume	253
Issue number	5016
State	Published - Jul 12 1991
Externally published	Yes

ASJC Scopus subject areas

General

Cite this

@article{e374feba5e32464798bd7a7b7b5e3669,

title = "Atomic force microscope studies of fullerene films: Highly stable C60 fcc (311) free surfaces",

abstract = "Atomic force microscopy and x-ray diffractometry were used to study 1500 {\AA}-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.",

author = "Snyder, {Eric J.} and Anderson, {Mark S.} and Tong, {William M.} and Williams, {R. Stanley} and Anz, {Samir J.} and Alvarez, {Marcos M.} and Yves Rubin and Diederich, {Fran{\c c}ois N.} and Whetten, {Robert L.}",

year = "1991",

month = jul,

day = "12",

language = "English (US)",

volume = "253",

pages = "171--173",

journal = "Science",

issn = "0036-8075",

publisher = "American Association for the Advancement of Science",

number = "5016",

}

TY - JOUR

T1 - Atomic force microscope studies of fullerene films

T2 - Highly stable C60 fcc (311) free surfaces

AU - Snyder, Eric J.

AU - Anderson, Mark S.

AU - Tong, William M.

AU - Williams, R. Stanley

AU - Anz, Samir J.

AU - Alvarez, Marcos M.

AU - Rubin, Yves

AU - Diederich, François N.

AU - Whetten, Robert L.

PY - 1991/7/12

Y1 - 1991/7/12

N2 - Atomic force microscopy and x-ray diffractometry were used to study 1500 Å-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

AB - Atomic force microscopy and x-ray diffractometry were used to study 1500 Å-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrate. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.

UR - http://www.scopus.com/inward/record.url?scp=0037581165&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037581165&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0037581165

SN - 0036-8075

VL - 253

SP - 171

EP - 173

JO - Science

JF - Science

IS - 5016

ER -

Atomic force microscope studies of fullerene films: Highly stable C₆₀ fcc (311) free surfaces

Abstract

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this