Application of aberration-corrected TEM and image simulation to nanoelectronics and nanotechnology
- Brian A. Korgel
- , D. C. Lee
- , Tobias Hanrath
- , Miguel José Yacaman
- , Alexander Thesen
- , Marco Matijevic
- , Roar Kilaas
- , Christian Kisielowski
- , Alain C. Diebold
Research output: Contribution to journal › Article › peer-review
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