Application of aberration-corrected TEM and image simulation to nanoelectronics and nanotechnology

Brian A. Korgel, D. C. Lee, Tobias Hanrath, Miguel José Yacaman, Alexander Thesen, Marco Matijevic, Roar Kilaas, Christian Kisielowski, Alain C. Diebold

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15 Scopus citations

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Engineering

Material Science