Application of aberration-corrected TEM and image simulation to nanoelectronics and nanotechnology
Brian A. Korgel, D. C. Lee, Tobias Hanrath, Miguel José Yacaman, Alexander Thesen, Marco Matijevic, Roar Kilaas, Christian Kisielowski, Alain C. Diebold
Research output: Contribution to journal › Article › peer-review
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