Application of aberration-corrected TEM and image simulation to nanoelectronics and nanotechnology

  • Brian A. Korgel
  • , D. C. Lee
  • , Tobias Hanrath
  • , Miguel José Yacaman
  • , Alexander Thesen
  • , Marco Matijevic
  • , Roar Kilaas
  • , Christian Kisielowski
  • , Alain C. Diebold

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

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Engineering

Material Science