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Anomalous diffraction in thin gold films

  • M. Jose-yacaman
  • , K. Truszkowska
  • , A. Gomez
  • , V. Castano
  • , E. P. Zironi
  • , K. Truszkowska

Research output: Contribution to journalArticlepeer-review

Abstract

STEM microdiffraction is used to study the structure of polycrystalline thin gold films grown at room temperature on a NaCl substrate. Individual grains were diffracted in regions having a lateral resolution of 120-400 Å.The patterns show anomalous spots which can be indexed in terms of a hexagonal net. A number of zone axes of the hexagonal structure are shown. Several possibilities for explaining the forbidden intensities are discussed.

Original languageEnglish (US)
Pages (from-to)315-327
Number of pages13
JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume51
Issue number2
DOIs
StatePublished - Feb 1985
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • General Materials Science
  • Condensed Matter Physics
  • Physics and Astronomy (miscellaneous)
  • Metals and Alloys

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