Anomalous diffraction in thin gold films

M. Jose-yacaman; K. Truszkowska; A. Gomez; V. Castano; E. P. Zironi; K. Truszkowska

doi:10.1080/01418618508237555

Anomalous diffraction in thin gold films

M. Jose-yacaman, K. Truszkowska, A. Gomez, V. Castano, E. P. Zironi, K. Truszkowska

Research output: Contribution to journal › Article › peer-review

Abstract

STEM microdiffraction is used to study the structure of polycrystalline thin gold films grown at room temperature on a NaCl substrate. Individual grains were diffracted in regions having a lateral resolution of 120-400 Å.The patterns show anomalous spots which can be indexed in terms of a hexagonal net. A number of zone axes of the hexagonal structure are shown. Several possibilities for explaining the forbidden intensities are discussed.

Original language	English (US)
Pages (from-to)	315-327
Number of pages	13
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	51
Issue number	2
DOIs	https://doi.org/10.1080/01418618508237555
State	Published - Feb 1985
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
General Materials Science
Condensed Matter Physics
Physics and Astronomy (miscellaneous)
Metals and Alloys

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10.1080/01418618508237555

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abstract = "STEM microdiffraction is used to study the structure of polycrystalline thin gold films grown at room temperature on a NaCl substrate. Individual grains were diffracted in regions having a lateral resolution of 120-400 {\AA}.The patterns show anomalous spots which can be indexed in terms of a hexagonal net. A number of zone axes of the hexagonal structure are shown. Several possibilities for explaining the forbidden intensities are discussed.",

author = "M. Jose-yacaman and K. Truszkowska and A. Gomez and V. Castano and Zironi, {E. P.} and K. Truszkowska",

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AU - Jose-yacaman, M.

AU - Truszkowska, K.

AU - Gomez, A.

AU - Castano, V.

AU - Zironi, E. P.

AU - Truszkowska, K.

PY - 1985/2

Y1 - 1985/2

N2 - STEM microdiffraction is used to study the structure of polycrystalline thin gold films grown at room temperature on a NaCl substrate. Individual grains were diffracted in regions having a lateral resolution of 120-400 Å.The patterns show anomalous spots which can be indexed in terms of a hexagonal net. A number of zone axes of the hexagonal structure are shown. Several possibilities for explaining the forbidden intensities are discussed.

AB - STEM microdiffraction is used to study the structure of polycrystalline thin gold films grown at room temperature on a NaCl substrate. Individual grains were diffracted in regions having a lateral resolution of 120-400 Å.The patterns show anomalous spots which can be indexed in terms of a hexagonal net. A number of zone axes of the hexagonal structure are shown. Several possibilities for explaining the forbidden intensities are discussed.

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ER -

Anomalous diffraction in thin gold films

Abstract

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