Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

Alejandra Garcia; Andres M. Raya; Marcelo M. Mariscal; Rodrigo Esparza; Miriam Herrera; Sergio I. Molina; Giovanni Scavello; Pedro L. Galindo; Miguel Jose-Yacaman; Arturo Ponce

doi:10.1016/j.ultramic.2014.05.004

Analysis of electron beam damage of exfoliated MoS₂ sheets and quantitative HAADF-STEM imaging

Alejandra Garcia, Andres M. Raya, Marcelo M. Mariscal, Rodrigo Esparza, Miriam Herrera, Sergio I. Molina, Giovanni Scavello, Pedro L. Galindo, Miguel Jose-Yacaman, Arturo Ponce

Research output: Contribution to journal › Article › peer-review

64 Scopus citations

Abstract

In this work we examined MoS₂ sheets by aberration-corrected scanning transmission electron microscopy (STEM) at three different energies: 80, 120 and 200kV. Structural damage of the MoS₂ sheets has been controlled at 80kV according a theoretical calculation based on the inelastic scattering of the electrons involved in the interaction electron-matter. The threshold energy for the MoS₂ material has been found and experimentally verified in the microscope. At energies higher than the energy threshold we show surface and edge defects produced by the electron beam irradiation. Quantitative analysis at atomic level in the images obtained at 80kV has been performed using the experimental images and via STEM simulations using SICSTEM software to determine the exact number of MoS₂ layers.

Original language	English (US)
Pages (from-to)	33-38
Number of pages	6
Journal	Ultramicroscopy
Volume	146
DOIs	https://doi.org/10.1016/j.ultramic.2014.05.004
State	Published - Nov 2014
Externally published	Yes

Keywords

Aberration-corrected microscopy
Low-voltage transmission electron microscopy
Molybdenum disulfide
Radiation damage

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/j.ultramic.2014.05.004

Cite this

@article{8494691e00114b078d8afa3f1f2548b7,

title = "Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging",

abstract = "In this work we examined MoS2 sheets by aberration-corrected scanning transmission electron microscopy (STEM) at three different energies: 80, 120 and 200kV. Structural damage of the MoS2 sheets has been controlled at 80kV according a theoretical calculation based on the inelastic scattering of the electrons involved in the interaction electron-matter. The threshold energy for the MoS2 material has been found and experimentally verified in the microscope. At energies higher than the energy threshold we show surface and edge defects produced by the electron beam irradiation. Quantitative analysis at atomic level in the images obtained at 80kV has been performed using the experimental images and via STEM simulations using SICSTEM software to determine the exact number of MoS2 layers.",

keywords = "Aberration-corrected microscopy, Low-voltage transmission electron microscopy, Molybdenum disulfide, Radiation damage",

author = "Alejandra Garcia and Raya, {Andres M.} and Mariscal, {Marcelo M.} and Rodrigo Esparza and Miriam Herrera and Molina, {Sergio I.} and Giovanni Scavello and Galindo, {Pedro L.} and Miguel Jose-Yacaman and Arturo Ponce",

note = "Funding Information: This project was supported by Grants from the National Center for Research Resources ( 5 G12RR013646-12 ) and the National Institute on Minority Health and Health Disparities ( G12MD007591 ) from the National Institutes of Health. The authors would like to acknowledge the NSF for support with grants DMR-1103730 , “Alloys at the Nanoscale: The Case of Nanoparticles Second Phase and PREM: NSF PREM Grant # DMR 0934218 . AR and SIM acknowledge the support from the Spanish MINECO (Projects TEC2011-29120-C05-03 and CONSOLIDER INGENIO 2010 CSD2009-00013 ) and the Junta de Andaluc{\'i}a , (PAI research group INNANOMAT, ref. TEP-946 ). M.M.M. acknowledges support from CONICET (CIAM-Program), ANPCyT ( PICT2010/1233 ) and Universidad Nacional de Cordoba .",

year = "2014",

month = nov,

doi = "10.1016/j.ultramic.2014.05.004",

language = "English (US)",

volume = "146",

pages = "33--38",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

}

TY - JOUR

T1 - Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging

AU - Garcia, Alejandra

AU - Raya, Andres M.

AU - Mariscal, Marcelo M.

AU - Esparza, Rodrigo

AU - Herrera, Miriam

AU - Molina, Sergio I.

AU - Scavello, Giovanni

AU - Galindo, Pedro L.

AU - Jose-Yacaman, Miguel

AU - Ponce, Arturo

N1 - Funding Information: This project was supported by Grants from the National Center for Research Resources ( 5 G12RR013646-12 ) and the National Institute on Minority Health and Health Disparities ( G12MD007591 ) from the National Institutes of Health. The authors would like to acknowledge the NSF for support with grants DMR-1103730 , “Alloys at the Nanoscale: The Case of Nanoparticles Second Phase and PREM: NSF PREM Grant # DMR 0934218 . AR and SIM acknowledge the support from the Spanish MINECO (Projects TEC2011-29120-C05-03 and CONSOLIDER INGENIO 2010 CSD2009-00013 ) and the Junta de Andalucía , (PAI research group INNANOMAT, ref. TEP-946 ). M.M.M. acknowledges support from CONICET (CIAM-Program), ANPCyT ( PICT2010/1233 ) and Universidad Nacional de Cordoba .

PY - 2014/11

Y1 - 2014/11

N2 - In this work we examined MoS2 sheets by aberration-corrected scanning transmission electron microscopy (STEM) at three different energies: 80, 120 and 200kV. Structural damage of the MoS2 sheets has been controlled at 80kV according a theoretical calculation based on the inelastic scattering of the electrons involved in the interaction electron-matter. The threshold energy for the MoS2 material has been found and experimentally verified in the microscope. At energies higher than the energy threshold we show surface and edge defects produced by the electron beam irradiation. Quantitative analysis at atomic level in the images obtained at 80kV has been performed using the experimental images and via STEM simulations using SICSTEM software to determine the exact number of MoS2 layers.

AB - In this work we examined MoS2 sheets by aberration-corrected scanning transmission electron microscopy (STEM) at three different energies: 80, 120 and 200kV. Structural damage of the MoS2 sheets has been controlled at 80kV according a theoretical calculation based on the inelastic scattering of the electrons involved in the interaction electron-matter. The threshold energy for the MoS2 material has been found and experimentally verified in the microscope. At energies higher than the energy threshold we show surface and edge defects produced by the electron beam irradiation. Quantitative analysis at atomic level in the images obtained at 80kV has been performed using the experimental images and via STEM simulations using SICSTEM software to determine the exact number of MoS2 layers.

KW - Aberration-corrected microscopy

KW - Low-voltage transmission electron microscopy

KW - Molybdenum disulfide

KW - Radiation damage

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AN - SCOPUS:84902355461

SN - 0304-3991

VL - 146

SP - 33

EP - 38

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -